Text Box: Dan Holcomb
Graduate Student
Electrical and Computer Engineering
University of Massachusetts Amherst

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Biography:

Born and raised near Boston, I began college at the University of Massachusetts with no technical background, intending to study philosophy. 5 years later, I graduated with a degree in computer systems engineering; my undergraduate thesis was the design and implementation of a payload and control algorithm for the world’s smallest altitude controlled research balloons. I got to apply this work in two major air quality studies, of New York City and Houston pollution plumes.

 

During my MS, I have researched particle-strike induced soft errors during two internships at Intel, and researched RFID security at the University of Massachusetts. My MS thesis is on low cost device identification and random number generation in integrated circuits.

 

Starting in Fall 07, I will begin working towards a PhD at UC Berkeley.

Publications:

V. Ambrose, W. Burleson, D. Holcomb, S. Mukherjee, J. Pickholtz, A Fast and Accurate Method for Simulating Soft Errors in Large Combinatorial Logic Circuits, Intel Design and Test Technology Conference, 2007

 

D. Holcomb, W. Burleson, K. Fu. Initial SRAM state as a fingerprint and source of true random numbers for RFID tags. In Proceedings of the Conference on RFID Security, July 2007. [paper] [demo]

 

E.E. Riddle, P.B. Voss, A. Stohl, D. Holcomb, D. Maczka, K. Washburn, R.W. Talbot, Trajectory model validation during ICARTT-2004 using newly developed altitude-controlled meteorological balloons, Journal of Geophysical Research, December 2006. [paper]

 

Voss, P.B., D.E. Holcomb, R.A. Zaveri, C.M. Berkowitz, Integrated system optimization of Controlled Meteorological (CMET) balloons, Proceedings of AIAA's 5th Annual Aviation Technology, Integration, and Operations (ATIO) Conference and AIAA 16th Lighter-than-air systems technology conference and balloons systems conference, Arlington, Virginia, 2005. [paper]

 

2 Pending Patents

Interconnect Circuit Design Group

RFID CUSP

 

Dr. Wayne P. Burleson

Dr. Kevin Fu

 

KEB 304, Dept of ECE

University of Massachusetts

Amherst, MA 01002

 

413-545-0188

413-545-1993

 

dholcomb at ecs dot umass edu